Dynamic analog testing via ATE digital test channels
| dc.citation.epage | 312 | en_US |
| dc.citation.spage | 308 | en_US |
| dc.contributor.author | Su, CC | en_US |
| dc.contributor.author | Chang, CS | en_US |
| dc.contributor.author | Huang, HW | en_US |
| dc.contributor.author | Tu, DS | en_US |
| dc.contributor.author | Lee, CL | en_US |
| dc.contributor.author | Lin, JCH | en_US |
| dc.contributor.department | 電機學院 | zh_TW |
| dc.contributor.department | College of Electrical and Computer Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:25:45Z | |
| dc.date.available | 2014-12-08T15:25:45Z | |
| dc.date.issued | 2004 | en_US |
| dc.description.abstract | A dynamic analog test methodology using digital tester is proposed. A simple triangular waveform is built on the device interface board for the stimulus generation. The response waveform is quantized by the dual comparators in a digital pin electronic circuit. Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect. The experimental results using an ATE show that the error is less than 2%. It confirms the feasibility of the proposed methodology. | en_US |
| dc.identifier.doi | 10.1109/ATS.2004.37 | en_US |
| dc.identifier.isbn | 0-7695-2235-1 | en_US |
| dc.identifier.issn | 1081-7735 | en_US |
| dc.identifier.journal | 13TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/ATS.2004.37 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/18185 | |
| dc.identifier.wosnumber | WOS:000225878400050 | |
| dc.language.iso | en_US | en_US |
| dc.title | Dynamic analog testing via ATE digital test channels | en_US |
| dc.type | Proceedings Paper | en_US |