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掃描探針式電子穿隧顯微鏡組裝及表面物理研究(II)

dc.contributor.author林登松en_US
dc.contributor.authorDENG-SUNGLINen_US
dc.contributor.department國立交通大學物理研究所zh_TW
dc.date.accessioned2014-12-13T10:39:07Z
dc.date.available2014-12-13T10:39:07Z
dc.date.issued1996en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC85-2112-M009-024zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=226736&docId=40803en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/96102
dc.language.isozh_TWen_US
dc.subject表面物理zh_TW
dc.subject材料物理zh_TW
dc.subject掃描探針式電子穿隧顯微鏡zh_TW
dc.subject分子束長晶zh_TW
dc.subject化學氣體長晶zh_TW
dc.subject超高真空zh_TW
dc.subjectSurface physicsen_US
dc.subjectMaterials physicsen_US
dc.subjectScanning tunneling microscopeen_US
dc.subjectMolecular-beam epitaxyen_US
dc.subjectChemical vapor depositionen_US
dc.subjectUltra-high vacuumen_US
dc.title掃描探針式電子穿隧顯微鏡組裝及表面物理研究(II)zh_TW
dc.titleStudy of Semiconductor Surfaces and Thin Film Physics Using Scanning Tunneling Microscopy(II)en_US
dc.typePlanen_US

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