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半導體裝置及其操作方法與應用電路

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumberI445051zh_TW
dc.contributor.author白田理一郎en_US
dc.contributor.author渡邊浩志en_US
dc.date.accessioned2014-12-16T06:11:43Z
dc.date.available2014-12-16T06:11:43Z
dc.date.issued2014-07-11en_US
dc.description.abstract一種半導體裝置及其操作方法與應用電路。藉由調整施加於雙重井區上的偏壓,來降低控制閘極擴散層、源極擴散層與汲極擴散層之間的漏電流,進而提高應用半導體裝置之無電池電子計時器的準確性並降低生產成本。zh_TW
dc.identifier.govdocH01L021/145zh_TW
dc.identifier.govdocH01L021/335zh_TW
dc.identifier.govdocH01L027/088zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/103154
dc.language.isozh_TWen_US
dc.title半導體裝置及其操作方法與應用電路zh_TW
dc.typePatentsen_US

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