串接式之高電子遷移率電晶體元件及其製造方法

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201218319zh_TW
dc.contributor.author張翼en_US
dc.contributor.author許恒通en_US
dc.date.accessioned2014-12-16T06:12:09Z
dc.date.available2014-12-16T06:12:09Z
dc.date.issued2012-05-01en_US
dc.description.abstract一種串接式之高電子遷移率電晶體元件的製造方法,該方法係利用製程中定義出多個高電子遷移率電晶體,並以內連接的方式將所述高電子遷移率電晶體進行串接。因此,在等效電路上可達到累加電壓的效果,故可形成具有高崩潰電壓特性的元件。zh_TW
dc.identifier.govdocH01L021/8232zh_TW
dc.identifier.govdocH01L021/335zh_TW
dc.identifier.govdocH01L027/085zh_TW
dc.identifier.govdocH01L029/778zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/103461
dc.language.isozh_TWen_US
dc.title串接式之高電子遷移率電晶體元件及其製造方法zh_TW
dc.typePatentsen_US

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