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用於快閃式記憶元件及電路性能與可靠性模擬的元件模式

dc.contributor.author莊紹勳en_US
dc.contributor.authorChung Steve Sen_US
dc.contributor.department交通大學電子工程系zh_TW
dc.date.accessioned2014-12-13T10:49:24Z
dc.date.available2014-12-13T10:49:24Z
dc.date.issued2000en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC89-2215-E009-046zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=542121&docId=99587en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/101626
dc.language.isozh_TWen_US
dc.subject快閃式記憶體zh_TW
dc.subject閘極電流模型zh_TW
dc.subject汲極電流模型zh_TW
dc.subjectSPICE模型zh_TW
dc.subject電路模擬器zh_TW
dc.subjectFlash memoryen_US
dc.subjectGate current modelen_US
dc.subjectDrain current modelen_US
dc.subjectSPICE modelen_US
dc.subjectCircuit simulatoren_US
dc.title用於快閃式記憶元件及電路性能與可靠性模擬的元件模式zh_TW
dc.titleA Compact Spice Model for Performance and Reliability Simulation of Flash EEPROM Cells and Circuitsen_US
dc.typePlanen_US

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