Data Analysis and Prediction for NAND Flash Decoding Status
| dc.citation.epage | 43 | en_US |
| dc.citation.spage | 40 | en_US |
| dc.contributor.author | Liao, Yen-Chin | en_US |
| dc.contributor.author | Huang, Ching-Hui | en_US |
| dc.contributor.author | Zeng, Cloud | en_US |
| dc.contributor.author | Chang, Hsie-Chia | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2018-08-21T05:56:49Z | |
| dc.date.available | 2018-08-21T05:56:49Z | |
| dc.date.issued | 2017-01-01 | en_US |
| dc.description.abstract | This paper investigates the feasibility of predicting the NAND flash decoding status by machine learning algorithms. The memory system can handle the future decoding failure in advance according to the prediction results so that to relieve the penalties. Several data preprocessing techniques to improve the accuracy are addressed. A thorough analysis flow is given and the experimental results show significant improvements. Incorporating with proper memory error handling schemes, a 34% improvement in throughput can be achieved. | en_US |
| dc.identifier.issn | 2330-7978 | en_US |
| dc.identifier.journal | 2017 IEEE 9TH INTERNATIONAL MEMORY WORKSHOP (IMW) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/146695 | |
| dc.identifier.wosnumber | WOS:000405189200010 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Data Analysis and Prediction for NAND Flash Decoding Status | en_US |
| dc.type | Proceedings Paper | en_US |
Files
License bundle
1 - 1 of 1
Loading...
- Name:
- license.txt
- Size:
- 1.71 KB
- Format:
- Item-specific license agreed to upon submission
- Description: