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REACTIVE ION ETCH OF GAAS AND ALGAAS USING BCL3, SICL4 AND SF6, INSTEAD OF CCL2F2

dc.citation.epage299en_US
dc.citation.spage295en_US
dc.citation.volume344en_US
dc.contributor.authorWU, JWen_US
dc.contributor.authorCHANG, CYen_US
dc.contributor.authorLIN, KCen_US
dc.contributor.authorCHANG, EYen_US
dc.contributor.authorHWANG, JHen_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:27:51Z
dc.date.available2014-12-08T15:27:51Z
dc.date.issued1994en_US
dc.identifier.isbn1-55899-244-8en_US
dc.identifier.issn0272-9172en_US
dc.identifier.journalMATERIALS AND PROCESSES FOR ENVIRONMENTAL PROTECTIONen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/20111
dc.identifier.wosnumberWOS:A1994BC30J00041
dc.language.isoen_USen_US
dc.titleREACTIVE ION ETCH OF GAAS AND ALGAAS USING BCL3, SICL4 AND SF6, INSTEAD OF CCL2F2en_US
dc.typeProceedings Paperen_US

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