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A new dynamic ternary sense amplifier for 1.5-bit/cell multi-level low-voltage CMOS DRAMS

dc.citation.epage50en_US
dc.citation.spage47en_US
dc.contributor.authorWu, CYen_US
dc.contributor.authorYu-Yee, Len_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:27:12Z
dc.date.available2014-12-08T15:27:12Z
dc.date.issued1999en_US
dc.description.abstractA novel 1.5-bit (3-level)/cell storage technique is described. This sense amplifier of DRAM can sense the ternary state. Thus, this structure can effectively reduce the bit-cost. The proposed DRAM can be operated at 1.5V without changing the common DRAM process.en_US
dc.identifier.isbn0-7803-5471-0en_US
dc.identifier.journalISCAS '99: PROCEEDINGS OF THE 1999 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 1: VLSIen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/19416
dc.identifier.wosnumberWOS:000081715100012
dc.language.isoen_USen_US
dc.titleA new dynamic ternary sense amplifier for 1.5-bit/cell multi-level low-voltage CMOS DRAMSen_US
dc.typeProceedings Paperen_US

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