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晶圓封裝打線製程之電腦視覺檢測與品質管制研究(I)

dc.contributor.author彭德保en_US
dc.contributor.authorPERNG DER-BAAUen_US
dc.contributor.department國立交通大學工業工程與管理學系zh_TW
dc.date.accessioned2014-12-13T10:33:02Z
dc.date.available2014-12-13T10:33:02Z
dc.date.issued2003en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC92-2213-E009-103zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=843508&docId=159796en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/91839
dc.language.isozh_TWen_US
dc.title晶圓封裝打線製程之電腦視覺檢測與品質管制研究(I)zh_TW
dc.titleVision Inspection and SPC Study for Wafer Wire-Bond Packaging (I)en_US
dc.typePlanen_US

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