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形成一T型閘極結構的方法

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201330111zh_TW
dc.contributor.author張翼en_US
dc.contributor.author黃祿哲en_US
dc.contributor.author張嘉華en_US
dc.contributor.author林岳欽en_US
dc.contributor.author成維華en_US
dc.contributor.author劉世謙en_US
dc.date.accessioned2014-12-16T06:11:51Z
dc.date.available2014-12-16T06:11:51Z
dc.date.issued2013-07-16en_US
dc.description.abstract形成T型閘極結構的方法。首先,提供一半導體基材,並於半導體基材上形成一具有至少兩種顯影速率之光阻體結構。接著,根據一遮罩,圖案化光阻體結構,其中係對該光阻體結構進行斜向曝光,並根據該至少兩種顯影速率顯影曝光後之光阻體結構,來形成一光阻槽道並暴露出部分半導體基材,其中所形成之光阻槽道具有一相較於底部還要寬的上方部分。接著,將閘極材質回填於光阻槽道,並移除圖案化光阻體結構,形成該T型閘極結構。zh_TW
dc.identifier.govdocH01L021/336zh_TW
dc.identifier.govdocH01L021/28zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/103236
dc.language.isozh_TWen_US
dc.title形成一T型閘極結構的方法zh_TW
dc.typePatentsen_US

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