Photoelastic modulation polarimetry and its measurement of twisted nematic liquid crystal
| dc.citation.epage | 51 | en_US |
| dc.citation.spage | 43 | en_US |
| dc.citation.volume | 4595 | en_US |
| dc.contributor.author | Chao, YF | en_US |
| dc.contributor.author | Lin, A | en_US |
| dc.contributor.author | Wang, MW | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:26:45Z | |
| dc.date.available | 2014-12-08T15:26:45Z | |
| dc.date.issued | 2001 | en_US |
| dc.description.abstract | For in situ/real time measurement, a retarder is substituted by a photoelastic modulator (PEM) in a polarimetry. The azimuthal position of the strain axis of PEM is directly determined with respect to the orientation of the transmission axis of polarizer and analyzer. The Mueller matrix of a twisted nematic liquid crystal (TN-LCD) is derived analytically. The phase retardation and the twisted angle of a TN-LCD are numerically obtained through two successive measurements of the Mueller polarimeter. | en_US |
| dc.identifier.doi | 10.1117/12.446589 | en_US |
| dc.identifier.isbn | 0-8194-4325-5 | en_US |
| dc.identifier.issn | 0277-786X | en_US |
| dc.identifier.journal | PHOTONIC SYSTEMS AND APPLICATIONS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1117/12.446589 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/19011 | |
| dc.identifier.wosnumber | WOS:000174463600006 | |
| dc.language.iso | en_US | en_US |
| dc.subject | polarimetry | en_US |
| dc.subject | photoelastic modulation | en_US |
| dc.subject | circular dichroism | en_US |
| dc.subject | liquid crystal | en_US |
| dc.title | Photoelastic modulation polarimetry and its measurement of twisted nematic liquid crystal | en_US |
| dc.type | Proceedings Paper | en_US |