Spectral Analysis of Noise Sources in InGaN Light Emitting Diodes
| dc.contributor.author | Lin, Gray | en_US |
| dc.contributor.author | Su, Kuan-Lin | en_US |
| dc.contributor.author | Yang, Shih-Tsun | en_US |
| dc.contributor.author | Chen, Tzung-Te | en_US |
| dc.contributor.author | Chen, Chiu-Ling | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:21:05Z | |
| dc.date.available | 2014-12-08T15:21:05Z | |
| dc.date.issued | 2011 | en_US |
| dc.description.abstract | Noise characterization of InGaN light emitting diodes shows that the exponent in current dependence of low-frequency flicker noise amplitude and the corner frequency in high-frequency generation-recombination noise spectra are two possible indicators for device reliability. (C) 2010 Optical Society of America | en_US |
| dc.identifier.isbn | 978-1-55752-910-7 | en_US |
| dc.identifier.journal | 2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/14990 | |
| dc.identifier.wosnumber | WOS:000295612403200 | |
| dc.language.iso | en_US | en_US |
| dc.title | Spectral Analysis of Noise Sources in InGaN Light Emitting Diodes | en_US |
| dc.type | Proceedings Paper | en_US |
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