超快掃描探針式顯微術及其應用之研究

dc.contributor.author	潘犀靈	en_US
dc.contributor.author	CI-LINGPAN	en_US
dc.contributor.department	交通大學光電工程研究所	zh_TW
dc.date.accessioned	2014-12-13T10:38:33Z
dc.date.available	2014-12-13T10:38:33Z
dc.date.issued	1997	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.identifier.govdoc	NSC86-2811-E009-001	zh_TW
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=278672&docId=50170	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/95490
dc.language.iso	zh_TW	en_US
dc.subject	近場	zh_TW
dc.subject	光學顯微術	zh_TW
dc.subject	時間序列分析	zh_TW
dc.subject	光譜分析	zh_TW
dc.subject	Near field	en_US
dc.subject	Optical microscopy	en_US
dc.subject	Time series analysis	en_US
dc.subject	Spectrum analysis	en_US
dc.title	超快掃描探針式顯微術及其應用之研究	zh_TW
dc.title	Ultrafast Scanning Probe Microscopies and Applications	en_US
dc.type	Plan	en_US

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