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Formation of inverted-pyramid structure by modifying laser processing parameters and acid etching time

dc.citation.epage72en_US
dc.citation.issue31en_US
dc.citation.spage67en_US
dc.citation.volume35en_US
dc.contributor.authorLin, Je-Weien_US
dc.contributor.authorLiu, En-Tingen_US
dc.contributor.authorWu, Chien-Hungen_US
dc.contributor.authorHsieh, Ing-Jaren_US
dc.contributor.authorChao, Tien-Shengen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2014-12-08T15:28:09Z
dc.date.available2014-12-08T15:28:09Z
dc.date.issued2011en_US
dc.description.abstractThis paper is to investigate the possibility to fabricate the inverted-pyramid structure on silicon wafer base solar cell by using laser scribing technology. The UV spectrometer and SEM had also been used to observe the reflectance and microstructure of the wafer surface. In this experiment, a Q-switched Nd:YAG laser operating at wavelength of 1064nm is used to scribe on the p-type wafer surface to produce inverted-pyramid structure. In order to remove the laser damage, we used acid etching and Alkaline etching solutions to smooth the damage region and inverted pyramid structure formed, simultaneously.en_US
dc.identifier.doi10.1149/1.3647856en_US
dc.identifier.isbn978-1-60768-291-2en_US
dc.identifier.issn1938-5862en_US
dc.identifier.journalSTUDENT POSTERS (GENERAL) - 219TH ECS MEETINGen_US
dc.identifier.urihttp://dx.doi.org/10.1149/1.3647856en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/20374
dc.identifier.wosnumberWOS:000309546100009
dc.language.isoen_USen_US
dc.titleFormation of inverted-pyramid structure by modifying laser processing parameters and acid etching timeen_US
dc.typeProceedings Paperen_US

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