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On the Analysis of Combined Synchronization Error Effects in OFDM Systems

dc.citation.epage1828en_US
dc.citation.spage1824en_US
dc.contributor.authorChin, Wen-Longen_US
dc.contributor.authorChen, Sau-Geeen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:25:30Z
dc.date.available2014-12-08T15:25:30Z
dc.date.issued2009en_US
dc.description.abstractThis work analyzes combined effects of major synchronization errors, including the symbol time offset (STO), carrier frequency offset (CFO) and sampling clock frequency offset (SCFO) of orthogonal frequency-division multiplexing (OFDM) systems. Such errors degrade the performance of an OFDM receiver by introducing inter-carrier interference (ICI) and inter-symbol interference (ISI) into the systems. Traditionally, designing an OFDM receiver needs plenty of Monte Carlo simulations because the synchronization errors are simultaneously inevitable in practical environments. Therefore, we formulate the theoretical signal-to-interference-and-noise ratio (SINR) to assist the design of OFDM receivers. By knowing the required SINR of specific application, all combinations of allowable errors can be derived. Then, cost-effective algorithms could be easily designed.en_US
dc.identifier.isbn978-1-4244-2516-7en_US
dc.identifier.issn1550-2252en_US
dc.identifier.journal2009 IEEE VEHICULAR TECHNOLOGY CONFERENCE, VOLS 1-5en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/17903
dc.identifier.wosnumberWOS:000273169200365
dc.language.isoen_USen_US
dc.titleOn the Analysis of Combined Synchronization Error Effects in OFDM Systemsen_US
dc.typeProceedings Paperen_US

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