Internal Quantum Efficiency Measurement in InGaN/GaN UV LEDs with Patterned Sapphire Substrate by Photoluminescence and Electroluminescence Method
| dc.contributor.author | Wang, C. H. | en_US |
| dc.contributor.author | Chiu, C. H. | en_US |
| dc.contributor.author | Ke, C. C. | en_US |
| dc.contributor.author | Kuo, H. C. | en_US |
| dc.contributor.author | Lu, T. C. | en_US |
| dc.contributor.author | Wang, S. C. | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:37:23Z | |
| dc.date.available | 2014-12-08T15:37:23Z | |
| dc.date.issued | 2010 | en_US |
| dc.description.abstract | Internal quantum efficiency (IQE) of InGaN-based ultraviolet light emitting diodes (LED) grown on patterned sapphire substrate (PSS) and flat sapphire were measured by photoluminescence and electroluminescence methods. The IQE improvement of PSS LED is significant. (C)2010 Optical Society of America | en_US |
| dc.identifier.isbn | 978-1-55752-890-2 | en_US |
| dc.identifier.journal | 2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/25709 | |
| dc.identifier.wosnumber | WOS:000290513602298 | |
| dc.language.iso | en_US | en_US |
| dc.title | Internal Quantum Efficiency Measurement in InGaN/GaN UV LEDs with Patterned Sapphire Substrate by Photoluminescence and Electroluminescence Method | en_US |
| dc.type | Article | en_US |
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