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利用飛秒級激發-檢測技術研究高溫超導體的特性

dc.contributor.author吳光雄en_US
dc.contributor.authorWU KAUNG-HSIUNGen_US
dc.contributor.department國立交通大學電子物理學系zh_TW
dc.date.accessioned2014-12-13T10:38:44Z
dc.date.available2014-12-13T10:38:44Z
dc.date.issued1996en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC85-2112-M009-004zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=227988&docId=41178en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/95617
dc.language.isozh_TWen_US
dc.subject飛秒級激發-檢測技術zh_TW
dc.subject超導薄膜光學反應zh_TW
dc.subject準粒子弛緩行為zh_TW
dc.subjectFemtosecond pump-probe techniqueen_US
dc.subjectOptical resoponse of HTSC thin filmen_US
dc.subjectQuasiparticle relaxation behavioren_US
dc.title利用飛秒級激發-檢測技術研究高溫超導體的特性zh_TW
dc.titleStudy the Characteristics of High Tc Superconductors by Femtosecond Pump-Probe Techniqueen_US
dc.typePlanen_US

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