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預測干擾觀測器應用於半導體製程的隨機干擾之開發研究

dc.contributor.author李安謙zh_TW
dc.contributor.authorLEE AN-CHENen_US
dc.contributor.department國立交通大學機械工程學系(所)zh_TW
dc.date.accessioned2016-03-28T08:17:30Z
dc.date.available2016-03-28T08:17:30Z
dc.date.issued2015en_US
dc.description.sponsorship科技部zh_TW
dc.identifier.govdocMOST104-2221-E009-027-MY2zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=11568455&docId=467851en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/130090
dc.language.isozh_TWen_US
dc.title預測干擾觀測器應用於半導體製程的隨機干擾之開發研究zh_TW
dc.titlePredictive Disturbance Observer Structure Applied to Semiconductor Manufacturing Process under Different Kinds of Stochastic Disturbancesen_US
dc.typePlanen_US

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