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Effects of annealing on magnetic properties of new ferromagnetic semiconductor (In, Al, Mn) As

dc.citation.epage2726en_US
dc.citation.issue10en_US
dc.citation.spage2724en_US
dc.citation.volume41en_US
dc.contributor.authorChen, YFen_US
dc.contributor.authorLee, WNen_US
dc.contributor.authorHuang, JHen_US
dc.contributor.authorChin, TSen_US
dc.contributor.authorGuo, XJen_US
dc.contributor.authorKu, HCen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.date.accessioned2014-12-08T15:18:19Z
dc.date.available2014-12-08T15:18:19Z
dc.date.issued2005-10-01en_US
dc.description.abstractThe effects of low-temperature (210 degrees C-290 degrees C) annealing on the microstructure, lattice constant, and magnetic properties of (In0.52Al0.48)(0.91)Mn0.09As grown by low-temperature molecular-beam epitaxy were studied. The results show that low-temperature annealing has little influence on the crystalline structure and interface quality Of (In0.52Al0.48)(0.91)Mn0.09As epilayer. In contrast, both the lattice constant and Curie temperature of (In0.52Al0.48)(0.91)Mn0.09As are found to be strongly dependent on the annealing temperature. The lattice constant linearly decreases with increasing annealing temperature; while the Curie temperature increases with increasing annealing temperature up to 250 degrees C, and then abruptly decreases upon further annealed at 270 degrees C and 290 degrees C.en_US
dc.identifier.doi10.1109/TMAG.2005.854687en_US
dc.identifier.issn0018-9464en_US
dc.identifier.journalIEEE TRANSACTIONS ON MAGNETICSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMAG.2005.854687en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/13209
dc.identifier.wosnumberWOS:000232679700055
dc.language.isoen_USen_US
dc.subjectdiluted magnetic semiconductoren_US
dc.subject(In, Al, Mn) Asen_US
dc.subjectspintronicsen_US
dc.subjectlow-temperature annealingen_US
dc.subjectmagnetic propertiesen_US
dc.titleEffects of annealing on magnetic properties of new ferromagnetic semiconductor (In, Al, Mn) Asen_US
dc.typeArticle; Proceedings Paperen_US

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