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利用斜向沈積形成之奈米結構薄膜及其方法

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumberI372418zh_TW
dc.contributor.author張家華en_US
dc.contributor.author楊勁生en_US
dc.contributor.author邱清華en_US
dc.contributor.author余沛慈en_US
dc.contributor.author郭浩中en_US
dc.date.accessioned2014-12-16T06:16:34Z
dc.date.available2014-12-16T06:16:34Z
dc.date.issued2012-09-11en_US
dc.description.abstract本發明提出了一種利用斜向沈積技術形成之透明導電氧化物奈米結構及其方法。該方法使用電子槍來蒸鍍靶材,其蒸鍍基板設置在多個可轉動傾斜的平板上,並具有氣體控制閥控制氣體的通入,及一加熱源控制腔體內溫度,並於蒸鍍後進行退火製程,以改善薄膜結構與光電性質。zh_TW
dc.identifier.govdocH01L021/20zh_TW
dc.identifier.govdocH01L031/18zh_TW
dc.identifier.govdocH01L033/00zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/105973
dc.language.isozh_TWen_US
dc.title利用斜向沈積形成之奈米結構薄膜及其方法zh_TW
dc.typePatentsen_US

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