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Stacked Gate Structure, Metal-Oxide-Semiconductor Including the Same, and Method for Manufacturing the Stacked Gate Structure

dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber20140151710zh_TW
dc.contributor.authorLIN Yueh-Chinen_US
dc.contributor.authorCHANG Edward Yien_US
dc.contributor.authorCHUANG Ting-Weien_US
dc.date.accessioned2014-12-16T06:14:48Z
dc.date.available2014-12-16T06:14:48Z
dc.date.issued2014-06-05en_US
dc.description.abstractThe invention provides a stacked gate structure and metal-oxide-semiconductor including the same, and method for manufacturing the stacked gate structure. The stacked gate structure comprises a substrate, a semiconductor layer positioned on the substrate, a gate dielectric positioned on the semiconductor layer, and a gate electrode layer positioned on the gate dielectric, which the gate dielectric comprises a composite oxide layer composed of lanthanum oxide (La2O3) and hafnium oxide (HfO2).zh_TW
dc.identifier.govdocH01L029/78zh_TW
dc.identifier.govdocH01L021/28zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/104912
dc.language.isozh_TWen_US
dc.titleStacked Gate Structure, Metal-Oxide-Semiconductor Including the Same, and Method for Manufacturing the Stacked Gate Structurezh_TW
dc.typePatentsen_US

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