Simulations of Electric Field Distributions by the Susceptor-Coupling Effects for 2.45GHz Microwave inside Microwave Chamber
| dc.citation.epage | 423 | en_US |
| dc.citation.spage | 420 | en_US |
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Hsueh, Fu-Kuo | en_US |
| dc.contributor.author | Chang, Chih-Chen | en_US |
| dc.contributor.author | Huang, Kun-Ping | en_US |
| dc.contributor.author | Lee, Yao-Jen | en_US |
| dc.contributor.author | Wu, Wen-Fa | en_US |
| dc.contributor.author | Chao, Tien-Sheng | en_US |
| dc.contributor.department | 電子物理學系 | zh_TW |
| dc.contributor.department | Department of Electrophysics | en_US |
| dc.date.accessioned | 2017-04-21T06:49:50Z | |
| dc.date.available | 2017-04-21T06:49:50Z | |
| dc.date.issued | 2015 | en_US |
| dc.identifier.isbn | 978-1-4799-9928-6 | en_US |
| dc.identifier.issn | 1946-1550 | en_US |
| dc.identifier.journal | PROCEEDINGS OF THE 22ND INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA 2015) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/136112 | |
| dc.identifier.wosnumber | WOS:000380466200107 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Simulations of Electric Field Distributions by the Susceptor-Coupling Effects for 2.45GHz Microwave inside Microwave Chamber | en_US |
| dc.type | Proceedings Paper | en_US |
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