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金屬氧化物輔助雷射脫附游離質譜法

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumberI274874zh_TW
dc.contributor.author陳月枝en_US
dc.contributor.author陳振泰en_US
dc.contributor.author林亞玄en_US
dc.date.accessioned2014-12-16T06:17:05Z
dc.date.available2014-12-16T06:17:05Z
dc.date.issued2007-03-01en_US
dc.description.abstract本發明提供一種之不需外加基質、簡單快速且成本低廉的金屬氧化物輔助雷射脫附游離質譜法,其係包括(a)以具有光吸收能力的無機金屬氧化物做為雷射脫附游離質譜法中輔助分析樣品進行脫附游離的基材,及(b)以檸檬酸緩衝溶液做為提供分析樣品質子化的來源。zh_TW
dc.identifier.govdocG01N030/72zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/106275
dc.language.isozh_TWen_US
dc.title金屬氧化物輔助雷射脫附游離質譜法zh_TW
dc.typePatentsen_US

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