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Preparation and characterization of new low-dielectric thin-film materials with fluorine.

dc.citation.epageU88en_US
dc.citation.issueen_US
dc.citation.spageU88en_US
dc.citation.volume225en_US
dc.contributor.authorChuang, SHen_US
dc.contributor.authorWan, CYen_US
dc.contributor.authorChiu, HTen_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.date.accessioned2014-12-08T15:41:17Z
dc.date.available2014-12-08T15:41:17Z
dc.date.issued2003-03-01en_US
dc.identifier.issn0065-7727en_US
dc.identifier.journalABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETYen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/28078
dc.identifier.wosnumberWOS:000187918000505
dc.language.isoen_USen_US
dc.titlePreparation and characterization of new low-dielectric thin-film materials with fluorine.en_US
dc.typeMeeting Abstracten_US

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