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<111>奈米雙晶銅墊層之銲錫接點的電遷移及界面冶金反應研究

dc.contributor.author陳智en_US
dc.contributor.authorChen Chihen_US
dc.contributor.department國立交通大學材料科學與工程學系(所)zh_TW
dc.date.accessioned2014-12-13T10:38:21Z
dc.date.available2014-12-13T10:38:21Z
dc.date.issued2013en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC102-2221-E009-040-MY3zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=3087570&docId=415367en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/95271
dc.language.isozh_TWen_US
dc.title&lt;111&gt;奈米雙晶銅墊層之銲錫接點的電遷移及界面冶金反應研究zh_TW
dc.titleElectromigration and Metallurgical Reactions in Solder Joints with ≪111≫-Oriented Nanotwinned Cu Metallizationen_US
dc.typePlanen_US

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