單晶片系統驗證之核心技術開發-子計畫六:針對先進晶片設計的熱點驗證之完整熱模型與高效能熱分析(I)

dc.contributor.author李育民en_US
dc.contributor.authorLEE YU-MINen_US
dc.contributor.department交通大學電信工程系zh_TW
dc.date.accessioned2014-12-13T10:30:12Z
dc.date.available2014-12-13T10:30:12Z
dc.date.issued2005en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC94-2220-E009-044zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=1147365&docId=220369en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/90034
dc.language.isozh_TWen_US
dc.title單晶片系統驗證之核心技術開發-子計畫六:針對先進晶片設計的熱點驗證之完整熱模型與高效能熱分析(I)zh_TW
dc.titleCompact Thermal Modeling and Efficient Thermal Simulation for Hot Spots Verifications of Modern IC Designs(I)en_US
dc.typePlanen_US

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