A cut-based method for terminal-pair reliability
| dc.citation.epage | 962 | en_US |
| dc.citation.spage | 958 | en_US |
| dc.contributor.author | Chen, YG | en_US |
| dc.contributor.author | Yuang, MC | en_US |
| dc.contributor.department | 資訊工程學系 | zh_TW |
| dc.contributor.department | Department of Computer Science | en_US |
| dc.date.accessioned | 2014-12-08T15:27:42Z | |
| dc.date.available | 2014-12-08T15:27:42Z | |
| dc.date.issued | 1995 | en_US |
| dc.identifier.isbn | 0-7803-2510-9 | en_US |
| dc.identifier.journal | GLOBECOM '95 - IEEE GLOBAL TELECOMMUNICATIONS CONFERENCE, VOLS 1-3 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/19948 | |
| dc.identifier.wosnumber | WOS:A1995BF42B00177 | |
| dc.language.iso | en_US | en_US |
| dc.title | A cut-based method for terminal-pair reliability | en_US |
| dc.type | Proceedings Paper | en_US |
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