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三元內容可定址記憶體之漏電流超截斷裝置

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumberI349288zh_TW
dc.contributor.author黃柏蒼en_US
dc.contributor.author劉文彥en_US
dc.contributor.author黃威en_US
dc.date.accessioned2014-12-16T06:16:46Z
dc.date.available2014-12-16T06:16:46Z
dc.date.issued2011-09-21en_US
dc.description.abstract一種應用於三元內容可定址記憶體之漏電流超截斷裝置,其於不同的操作模式下,控制高端與低端閘極電源電晶體之導通或截止以降低三元內容可定址記憶體無關項記憶胞之漏電流。zh_TW
dc.identifier.govdocG11C007/12zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/106071
dc.language.isozh_TWen_US
dc.title三元內容可定址記憶體之漏電流超截斷裝置zh_TW
dc.typePatentsen_US

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