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Package Routability- and IR-Drop-Aware Finger/Pad Assignment in Chip-Package Co-Design

dc.citation.epage+en_US
dc.citation.spage845en_US
dc.citation.woscount4en_US
dc.contributor.authorLu, Chao-Hungen_US
dc.contributor.authorChen, Hung-Mingen_US
dc.contributor.authorLiu, Chien-Nan Jimmyen_US
dc.contributor.authorShih, Wen-Yuen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2017-04-21T06:49:40Z
dc.date.available2017-04-21T06:49:40Z
dc.date.issued2009en_US
dc.description.abstractDue to increasing complexity of design interactions between the chip, package and PCB, it is essential to consider them at the same time. Specifically the finger/pad locations affect the performance of the chip and the package significantly. In this paper, we have. developed techniques in chip-package codesign to decide the locations of fingers/pads for package routability and signal integrity concerns in chip core design. Our finger/pad assignment is a two-step method: first we optimize the wire congestion problem in package routing, and then we try to minimize the IR-drop violation with finger/pad solution refinement The experimental results are encouraging. Compared with the randomly optimized methods, our approaches reduce in average 42% and 68% of the maximum density in package and 10.61% of IR-drop for test circuits.en_US
dc.identifier.isbn978-1-4244-3781-8en_US
dc.identifier.issn1530-1591en_US
dc.identifier.journalDATE: 2009 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, VOLS 1-3en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/134412
dc.identifier.wosnumberWOS:000273246700150en_US
dc.language.isoen_USen_US
dc.titlePackage Routability- and IR-Drop-Aware Finger/Pad Assignment in Chip-Package Co-Designen_US
dc.typeProceedings Paperen_US

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