Self-Heating Induced Feedback Effect on Drain Current Mismatch and Its Modeling
| dc.contributor.author | Kuo, Jack J-Y. | en_US |
| dc.contributor.author | Su, Pin | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:21:19Z | |
| dc.date.available | 2014-12-08T15:21:19Z | |
| dc.date.issued | 2011 | en_US |
| dc.description.abstract | We have reported and modeled a self-heating induced feedback effect on the drain current mismatch of nanoscale MOSFETs. The accuracy of the new model has been verified with experimental data. This effect needs to be considered when one-to-one comparisons between SOI and bulk devices regarding the variability are made. | en_US |
| dc.identifier.isbn | 978-1-4577-0505-2 | en_US |
| dc.identifier.journal | 2011 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/15144 | |
| dc.identifier.wosnumber | WOS:000300015300028 | |
| dc.language.iso | en_US | en_US |
| dc.title | Self-Heating Induced Feedback Effect on Drain Current Mismatch and Its Modeling | en_US |
| dc.type | Proceedings Paper | en_US |
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