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以資料分析為導向之新型態電子設計自動化研究---子計畫四:多選擇策略之製程熱點偵測( I )

dc.contributor.author江蕙如en_US
dc.contributor.authorJiang Iris Hui-Ruen_US
dc.contributor.department國立交通大學電子工程學系及電子研究所zh_TW
dc.date.accessioned2014-12-13T10:43:39Z
dc.date.available2014-12-13T10:43:39Z
dc.date.issued2014en_US
dc.description.sponsorship科技部zh_TW
dc.identifier.govdocMOST103-2220-E009-013zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=8279792&docId=437700en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/99827
dc.language.isozh_TWen_US
dc.title以資料分析為導向之新型態電子設計自動化研究---子計畫四:多選擇策略之製程熱點偵測( I )zh_TW
dc.titleA Multi-Selection-Based Lithographic Hotspot Detection Framework( I )en_US
dc.typePlanen_US

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