Fabrication of true apodized fiber Bragg grating using a new two-beam interferometer with polarization control
| dc.citation.patentcountry | USA | zh_TW |
| dc.citation.patentnumber | 06963432 | zh_TW |
| dc.contributor.author | Chuang | en_US |
| dc.contributor.author | Kai-Ping | en_US |
| dc.contributor.author | Sheu | en_US |
| dc.contributor.author | Lih-Gen | en_US |
| dc.contributor.author | Tsai | en_US |
| dc.contributor.author | Meng-Chang | en_US |
| dc.contributor.author | Lai | en_US |
| dc.contributor.author | Yinchieh | en_US |
| dc.date.accessioned | 2014-12-16T06:14:36Z | |
| dc.date.available | 2014-12-16T06:14:36Z | |
| dc.date.issued | 2005-11-08 | en_US |
| dc.description.abstract | The present invention provides a two-beam interference exposure system that can be simply adjusted by rotating only one mirror. By placing a half-wave plate in one of the interference arms and precisely scanning the relative fiber position, the present invention can expose true apodized fiber Bragg gratings in a single scan by simultaneously rotating the angle of the half-wave plate. By rotationally switching the fast and slow axes of the half-wave plate, the present invention can also expose n-phase-shifted fiber grating by the same system. | zh_TW |
| dc.identifier.govdoc | C03B037/018 | zh_TW |
| dc.identifier.govdoc | C03C025/00 | zh_TW |
| dc.identifier.govdoc | G03H001/04 | zh_TW |
| dc.identifier.govdoc | G02B005/30 | zh_TW |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/104827 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | Fabrication of true apodized fiber Bragg grating using a new two-beam interferometer with polarization control | zh_TW |
| dc.type | Patents | en_US |