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The Overview of 2013 CAD Contest at ICCAD

dc.citation.epage264en_US
dc.citation.spage264en_US
dc.contributor.authorJiang, Iris Hui-Ruen_US
dc.contributor.authorLi, Zhuoen_US
dc.contributor.authorWang, Hwei-Tsengen_US
dc.contributor.authorViswanathan, Natarajanen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:34:50Z
dc.date.available2014-12-08T15:34:50Z
dc.date.issued2013en_US
dc.identifier.isbn978-1-4799-1071-7en_US
dc.identifier.issn1933-7760en_US
dc.identifier.journal2013 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN (ICCAD)en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/23713
dc.identifier.wosnumberWOS:000331072100039
dc.language.isoen_USen_US
dc.subjectTechnology mappingen_US
dc.subjectplacementen_US
dc.subjectlithographyen_US
dc.titleThe Overview of 2013 CAD Contest at ICCADen_US
dc.typeProceedings Paperen_US

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