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Phase-locked loop with loop gain calibration, gain measurement method, gain calibration method and jitter measurement method for phase-locked loop

dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber08860478zh_TW
dc.contributor.authorChen Wei-Zenen_US
dc.contributor.authorChuang Shu-Chinen_US
dc.date.accessioned2014-12-16T06:13:47Z
dc.date.available2014-12-16T06:13:47Z
dc.date.issued2014-10-14en_US
dc.description.abstractThe invention provides a phase-locked loop with loop gain calibration and methods for measuring an oscillator gain, gain calibration and jitter measurement for a phase-locked loop. The method for measuring an oscillator gain of a phase-locked loop includes the steps of providing a varying code at an input end of the oscillator; outputting excess reference phase information by a reference phase integral path and outputting excess feedback phase information based on the varying code by a feedback phase integral path; and obtaining an estimated gain information of the oscillator based on the excess reference phase information and the excess feedback phase information.zh_TW
dc.identifier.govdocH03L007/08zh_TW
dc.identifier.govdocG01R025/00zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/104334
dc.language.isozh_TWen_US
dc.titlePhase-locked loop with loop gain calibration, gain measurement method, gain calibration method and jitter measurement method for phase-locked loopzh_TW
dc.typePatentsen_US

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