光學檢測機台之智慧型缺陷識別技術
| dc.contributor.author | 林錫寬 | en_US |
| dc.contributor.author | LIN SHIR-KUAN | en_US |
| dc.contributor.department | 交通大學電機與控制工程系 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:31:53Z | |
| dc.date.available | 2014-12-13T10:31:53Z | |
| dc.date.issued | 2004 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC93-2622-E009-007-CC3 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=1032770&docId=196923 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/91215 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 光學檢測機台之智慧型缺陷識別技術 | zh_TW |
| dc.title | Intelligent Defect Recognition in an AOI Machine | en_US |
| dc.type | Plan | en_US |