Fabrication of true apodized fiber bragg grating using a new two-beam interferometer with polarization control
| dc.citation.patentcountry | USA | zh_TW |
| dc.citation.patentnumber | 20050152646 | zh_TW |
| dc.contributor.author | Chuang, Kai-Ping | en_US |
| dc.contributor.author | Sheu, Lih-Gen | en_US |
| dc.contributor.author | Tsai, Meng-Chang | en_US |
| dc.contributor.author | Lai, Yinchieh | en_US |
| dc.date.accessioned | 2014-12-16T06:16:17Z | |
| dc.date.available | 2014-12-16T06:16:17Z | |
| dc.date.issued | 2005-07-14 | en_US |
| dc.description.abstract | The present invention provides a two-beam interference exposure system that can be simply adjusted by rotating only one mirror. By placing a half-wave plate in one of the interference arms and precisely scanning the relative fiber position, the present invention can expose true apodized fiber Bragg gratings in a single scan by simultaneously rotating the angle of the half-wave plate. By rotationally switching the fast and slow axes of the half-wave plate, the present invention can also expose n-phase-shifted fiber grating by the same system. | zh_TW |
| dc.identifier.govdoc | G02B006/34 | zh_TW |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/105738 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | Fabrication of true apodized fiber bragg grating using a new two-beam interferometer with polarization control | zh_TW |
| dc.type | Patents | en_US |