Direct observation of the lateral nonuniform channel doping profile in submicron MOSFET's from an anomalous charge pumping measurement results
| dc.citation.epage | 104 | en_US |
| dc.citation.spage | 103 | en_US |
| dc.contributor.author | Chung, SS | en_US |
| dc.contributor.author | Cheng, SM | en_US |
| dc.contributor.author | Lee, GH | en_US |
| dc.contributor.author | Guo, JC | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:27:48Z | |
| dc.date.available | 2014-12-08T15:27:48Z | |
| dc.date.issued | 1995 | en_US |
| dc.identifier.doi | 10.1109/VLSIT.1995.520878 | en_US |
| dc.identifier.isbn | 0-7803-2602-4 | en_US |
| dc.identifier.journal | 1995 SYMPOSIUM ON VLSI TECHNOLOGY: DIGEST OF TECHNICAL PAPERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/VLSIT.1995.520878 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/20048 | |
| dc.identifier.wosnumber | WOS:A1995BE44J00052 | |
| dc.language.iso | en_US | en_US |
| dc.title | Direct observation of the lateral nonuniform channel doping profile in submicron MOSFET's from an anomalous charge pumping measurement results | en_US |
| dc.type | Proceedings Paper | en_US |