A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine
| dc.citation.epage | U1056 | en_US |
| dc.citation.spage | 222 | en_US |
| dc.citation.volume | 56 | en_US |
| dc.citation.woscount | 1 | en_US |
| dc.contributor.author | Ho, Kin-Chu | en_US |
| dc.contributor.author | Fang, Po-Chao | en_US |
| dc.contributor.author | Li, Hsiang-Pang | en_US |
| dc.contributor.author | Wang, Cheng-Yuan Michael | en_US |
| dc.contributor.author | Chang, Hsie-Chia | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.date.accessioned | 2016-03-28T00:05:45Z | |
| dc.date.available | 2016-03-28T00:05:45Z | |
| dc.date.issued | 2013-01-01 | en_US |
| dc.description.abstract | en_US | |
| dc.identifier.isbn | 978-1-4673-4513-2; 978-1-4673-4515-6 | en_US |
| dc.identifier.issn | 0193-6530 | en_US |
| dc.identifier.journal | 2013 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE DIGEST OF TECHNICAL PAPERS (ISSCC) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/129819 | |
| dc.identifier.wosnumber | WOS:000366612300091 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | A 45nm 6b/cell Charge-Trapping Flash Memory Using LDPC-Based ECC and Drift-Immune Soft-Sensing Engine | en_US |
| dc.type | Proceedings Paper | en_US |
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