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A broadband and scalable model for on-chip inductors incorporating substrate and conductor loss effects

dc.citation.epage596en_US
dc.citation.spage593en_US
dc.contributor.authorGuo, JCen_US
dc.contributor.authorTan, TYen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:25:25Z
dc.date.available2014-12-08T15:25:25Z
dc.date.issued2005en_US
dc.description.abstractA new T-model is developed to accurately simulate the broadband characteristics of on-Si-chip spiral inductors, up to 20GHz. The spiral coil and substrate RLC networks built in the model play a key role responsible for conductor loss and substrate loss in the wideband regime, which cannot be accurately described by the conventional pi-model. Good match with the measured S-parameters, L(omega), Re(Z(in)(omega)), and Q(omega) proves the proposed T-model. Besides the broadband feature, scalability is justified by the good match with a linear function of coil numbers for all model parameters employed in the RLC networks. The satisfactory scalability manifest themselves physical parameters rather than curve fitting. A parameter extraction flow is established through equivalent circuit analysis to enable automatic parameter extraction and optimization. This scalable inductor model will facilitate optimization design of on-chip inductor and the accuracy proven up to 20GHz can improve RF circuit simulation accuracy demanded by broadband design.en_US
dc.identifier.isbn0-7803-8983-2en_US
dc.identifier.issn1529-2517en_US
dc.identifier.journal2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, Digest of Papersen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/17815
dc.identifier.wosnumberWOS:000230541500134
dc.language.isoen_USen_US
dc.subjecttriductoren_US
dc.subjectlossy substrateen_US
dc.subjectbroadbanden_US
dc.subjectscalableen_US
dc.titleA broadband and scalable model for on-chip inductors incorporating substrate and conductor loss effectsen_US
dc.typeProceedings Paperen_US

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