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Displacement measurement system and method thereof

dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber08089631zh_TW
dc.contributor.authorHsu Kuei-Chuen_US
dc.contributor.authorChen Chii-Changen_US
dc.contributor.authorChan Chia-Huaen_US
dc.contributor.authorLai Yin-Chiehen_US
dc.date.accessioned2014-12-16T06:14:17Z
dc.date.available2014-12-16T06:14:17Z
dc.date.issued2012-01-03en_US
dc.description.abstractA displacement measurement system including a coherent light source, a two-dimensional grating, a photo sensor, and a signal processing apparatus is provided. After the coherent light beam enters the two-dimensional grating, a zero-order light beam and a plurality of first-order diffraction beams are generated. The zero-order light beam interferes with two of the first-order beams in different directions, so that corresponding interference fringes are formed on the photo sensor. Accordingly, when the two-dimensional grating moves, displacements of the two-dimensional grating in the different directions are obtained by calculating phase differences of the interference fringes in the corresponding directions. Besides, when the two-dimensional grating rotates, the rotational angle of the two-dimensional grating is obtained from the corresponding rotational angle of a diffraction pattern of the first-order diffraction beams.zh_TW
dc.identifier.govdocG01B011/02zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/104622
dc.language.isozh_TWen_US
dc.titleDisplacement measurement system and method thereofzh_TW
dc.typePatentsen_US

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