CMOS玻璃蓋片視覺檢測系統與瑕疵分類方法之研究(II)
| dc.contributor.author | 彭德保 | en_US |
| dc.contributor.author | PERNG DER-BAAU | en_US |
| dc.contributor.department | 國立交通大學工業工程與管理學系(所) | zh_TW |
| dc.date.accessioned | 2014-12-13T10:29:58Z | |
| dc.date.available | 2014-12-13T10:29:58Z | |
| dc.date.issued | 2006 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC95-2221-E009-140 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=1309086&docId=241877 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/89857 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | CMOS玻璃蓋片視覺檢測系統與瑕疵分類方法之研究(II) | zh_TW |
| dc.title | The Researches of Defect Inspeciton and Classification of the CMOS Glass Lid (II) | en_US |
| dc.type | Plan | en_US |
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