張力型矽鍺奈米CMOS元件通道工程及可靠性關鍵問題研究(III)
| dc.contributor.author | 莊紹勳 | en_US |
| dc.contributor.author | Chung Steve S | en_US |
| dc.contributor.department | 國立交通大學電子工程學系及電子研究所 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:51:52Z | |
| dc.date.available | 2014-12-13T10:51:52Z | |
| dc.date.issued | 2007 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC96-2221-E009-185 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=1473703&docId=264692 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/102959 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 張力型矽鍺奈米CMOS元件通道工程及可靠性關鍵問題研究(III) | zh_TW |
| dc.title | Key Issues of Channel Engineering and Reliability for Strained-Si/SiGe Nanometer Gate Length CMOS Devices(III) | en_US |
| dc.type | Plan | en_US |
Files
License bundle
1 - 1 of 1
Loading...
- Name:
- license.txt
- Size:
- 1.71 KB
- Format:
- Item-specific license agreed to upon submission
- Description: