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An augmented system model for fault detection and identification

dc.citation.epage606en_US
dc.citation.spage602en_US
dc.contributor.authorLIU, TSen_US
dc.contributor.authorLIOU, JJen_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.date.accessioned2014-12-08T15:27:44Z
dc.date.available2014-12-08T15:27:44Z
dc.date.issued1995en_US
dc.identifier.isbn0-7803-2446-3en_US
dc.identifier.journalPROCEEDINGS OF THE 1995 AMERICAN CONTROL CONFERENCE, VOLS 1-6en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/19985
dc.identifier.wosnumberWOS:A1995BD66H00128
dc.language.isoen_USen_US
dc.titleAn augmented system model for fault detection and identificationen_US
dc.typeProceedings Paperen_US

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