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電容式觸控面板之多點感測法

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201019194zh_TW
dc.contributor.author陳建廷en_US
dc.contributor.author趙昌博en_US
dc.contributor.author阮俊堯en_US
dc.date.accessioned2014-12-16T06:12:44Z
dc.date.available2014-12-16T06:12:44Z
dc.date.issued2010-05-16en_US
dc.description.abstract一種電容式觸控面板之多點感測法,係以一電容偵測電路感測同一電極層上各電極之電壓變化,當偵測到電極發生電壓變化處,再於該電壓變化處量測不同電極層上分別相互交錯之二電極所構成之垂直電容,經與未觸控前由該二電極交錯形成之垂直電容相比對,當有相異處即為實際之觸控點。zh_TW
dc.identifier.govdocG06F003/044zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/103746
dc.language.isozh_TWen_US
dc.title電容式觸控面板之多點感測法zh_TW
dc.typePatentsen_US

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