Broad Angular and Spectral Anti-Reflection Employing GaN Nano-Pillar Structures
| dc.citation.epage | 1326 | en_US |
| dc.citation.spage | 1325 | en_US |
| dc.contributor.author | Chiu, C. H. | en_US |
| dc.contributor.author | Yu, Peichen | en_US |
| dc.contributor.author | Chen, C. C. | en_US |
| dc.contributor.author | Kuo, H. C. | en_US |
| dc.contributor.author | Lu, T. C. | en_US |
| dc.contributor.author | Wang, S. C. | en_US |
| dc.contributor.author | Wang, S. C. | en_US |
| dc.contributor.author | Hsu, S. S. | en_US |
| dc.contributor.author | Cheng, Y. J. | en_US |
| dc.contributor.author | Chang, Y. C. | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:46:54Z | |
| dc.date.available | 2014-12-08T15:46:54Z | |
| dc.date.issued | 2008 | en_US |
| dc.description.abstract | Angular and spectral reflectivities of GaN nano-pillar structures are investigated for heights of 350nm, 550nm and 720 nm. Calculations based on rigorous coupled-wave analysis show excellent agreement with the measured reflectivities for s- and p-polarizations. (c) 2008 Optical Society of America | en_US |
| dc.identifier.isbn | 978-1-55752-859-9 | en_US |
| dc.identifier.journal | 2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/31520 | |
| dc.identifier.wosnumber | WOS:000260498400665 | |
| dc.language.iso | en_US | en_US |
| dc.title | Broad Angular and Spectral Anti-Reflection Employing GaN Nano-Pillar Structures | en_US |
| dc.type | Article | en_US |
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