INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETS
| dc.citation.epage | 164 | en_US |
| dc.citation.spage | 161 | en_US |
| dc.contributor.author | WANG, TH | en_US |
| dc.contributor.author | CHANG, TE | en_US |
| dc.contributor.author | HUANG, CM | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:27:51Z | |
| dc.date.available | 2014-12-08T15:27:51Z | |
| dc.date.issued | 1994 | en_US |
| dc.identifier.isbn | 0-7803-2111-1 | en_US |
| dc.identifier.journal | INTERNATIONAL ELECTRON DEVICES MEETING 1994 - IEDM TECHNICAL DIGEST | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/20108 | |
| dc.identifier.wosnumber | WOS:A1994BC55U00036 | |
| dc.language.iso | en_US | en_US |
| dc.title | INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETS | en_US |
| dc.type | Proceedings Paper | en_US |
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