氫效應在異質接面電晶體所引起的穩定性及可靠性問題

dc.contributor.author	李建平	en_US
dc.contributor.author	LEE CHIEN-PING	en_US
dc.contributor.department	交通大學電子工程系	zh_TW
dc.date.accessioned	2014-12-13T10:47:49Z
dc.date.available	2014-12-13T10:47:49Z
dc.date.issued	2000	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.identifier.govdoc	NSC89-2215-E009-060	zh_TW
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=542135&docId=99591	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/101127
dc.language.iso	zh_TW	en_US
dc.subject	異質接面電晶體	zh_TW
dc.subject	有機金屬化學氣相沈積法	zh_TW
dc.subject	可靠度	zh_TW
dc.subject	HBT	en_US
dc.subject	MOCVD	en_US
dc.subject	Reliability	en_US
dc.title	氫效應在異質接面電晶體所引起的穩定性及可靠性問題	zh_TW
dc.title	Hydrogen Related Stability and Reliability Issues of GaAs Based HBTs	en_US
dc.type	Plan	en_US

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