Auto Defect Detection of A-IGZO Thin Film Transistor Backplane on Foldable Medical Array Panel Application
| dc.citation.epage | 1425 | en_US |
| dc.citation.spage | 1423 | en_US |
| dc.contributor.author | Hung, Yu-Min | en_US |
| dc.contributor.author | Wang, Yao-Chin | en_US |
| dc.contributor.author | Yang, Yu-Ching | en_US |
| dc.contributor.author | Lin, Bor-Shyh | en_US |
| dc.contributor.author | Lin, Bor-Shing | en_US |
| dc.contributor.department | 光電學院 | zh_TW |
| dc.contributor.department | College of Photonics | en_US |
| dc.date.accessioned | 2018-08-21T05:57:06Z | |
| dc.date.available | 2018-08-21T05:57:06Z | |
| dc.date.issued | 2017-01-01 | en_US |
| dc.description.abstract | This article reported on the pixel flaw detection properties of amorphous In-Ga-Zn-O-based active thin film transistors on flexible medical panel substrate application, which is using the non-invasive optoelectronic transforming inspection technique. The experimental data exactly showed good flaw detection rate > 90% and stable uniformity < 5%. Currently, it is a popular method with electrical testing and detection with advantages of ultrahigh resolution and small-pixel-sized medical panel, and no contact damaged to the application of flexible medical panel substrates. | en_US |
| dc.identifier.journal | 2017 COMPUTING CONFERENCE | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/147057 | |
| dc.identifier.wosnumber | WOS:000426944400193 | en_US |
| dc.language.iso | en_US | en_US |
| dc.subject | a-IGZO | en_US |
| dc.subject | thin film transistor | en_US |
| dc.subject | foldable medical array panel | en_US |
| dc.subject | detection | en_US |
| dc.title | Auto Defect Detection of A-IGZO Thin Film Transistor Backplane on Foldable Medical Array Panel Application | en_US |
| dc.type | Proceedings Paper | en_US |
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