Lamp configuration design for rapid thermal processing systems

dc.citation.epage84en_US
dc.citation.issue1en_US
dc.citation.spage75en_US
dc.citation.volume11en_US
dc.citation.woscount22
dc.contributor.authorJan, YKen_US
dc.contributor.authorLin, CAen_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:49:23Z
dc.date.available2014-12-08T15:49:23Z
dc.date.issued1998-02-01en_US
dc.description.abstractWe study lamp configuration design for rapid thermal processing (RTP) systems, We consider a configuration consists of four concentric circular lamp zones, three of them above the wafer and one circumvallating the wafer, We propose a method to determine the geometric parameters, the width, height and radius, of the lamp zones so that the configuration designed has the capacity to achieve uniform temperature on the wafer, The method is based on a necessary and sufficient condition for uniform temperature tracking and analytic expressions of the view factors, A design example is given in which a least square open-loop control law yields good temperature uniformity.en_US
dc.identifier.issn0894-6507en_US
dc.identifier.journalIEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURINGen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/32837
dc.identifier.wosnumberWOS:000071871500012
dc.language.isoen_USen_US
dc.subjectlamp configuration designen_US
dc.subjectrapid thermal processingen_US
dc.subjecttrackingen_US
dc.subjectuniform temperatureen_US
dc.titleLamp configuration design for rapid thermal processing systemsen_US
dc.typeArticleen_US

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