Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution
| dc.citation.epage | 89 | en_US |
| dc.citation.spage | 84 | en_US |
| dc.contributor.author | Ker, MD | en_US |
| dc.contributor.author | Peng, JJ | en_US |
| dc.contributor.author | Jiang, HC | en_US |
| dc.contributor.department | 電機學院 | zh_TW |
| dc.contributor.department | College of Electrical and Computer Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:26:28Z | |
| dc.date.available | 2014-12-08T15:26:28Z | |
| dc.date.issued | 2002 | en_US |
| dc.identifier.isbn | 0-7803-7416-9 | en_US |
| dc.identifier.journal | PROCEEDINGS OF THE 9TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/18796 | |
| dc.identifier.wosnumber | WOS:000177689400016 | |
| dc.language.iso | en_US | en_US |
| dc.title | Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution | en_US |
| dc.type | Proceedings Paper | en_US |
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